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Details for article 65 of 187 found articles
| Title: |
Erratum to “Infrared spectroscopy and X-ray diffraction studies on the crystallographic evolution of La2O3 films upon annealing” Microelectronic Engineering 85 (2008) 2411–2413 |
| Author: |
Tsoutsou, D. Scarel, G. Debernardi, A. Capelli, S.C. Volkos, S.N. Lamagna, L. Schamm, S. Coulon, P.E. Fanciulli, M. |
| Appeared in: |
Microelectronic engineering |
| Paging: | Volume 86 (2009) nr. 10 pages 1 p. |
| Year: |
2009 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 65 of 187 found articles
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