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Journal description
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Details for article 14 of 117 found articles
| Title: |
Characterization of complex inter-layer dielectric stack by spectroscopic ellipsometry: A simple method to reduce parameters correlations |
| Author: |
Likhachev, D.V. |
| Appeared in: |
Thin solid films |
| Paging: | Volume 550 (2014) nr. C pages 7 p. |
| Year: |
2014 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 14 of 117 found articles
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