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Journal description
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Details for article 13 of 22 found articles
| Title: |
Profiling of SiGe superlattices by He backscattering |
| Author: |
Kasper, E. Pabst, W. |
| Appeared in: |
Thin solid films |
| Paging: | Volume 37 (1976) nr. 1 pages nvt p. |
| Year: |
1976 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 13 of 22 found articles
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