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Details for article 15 of 16 found articles
| Title: |
Total-ionization-dose characterization of a radiation-hardened mixed-signal microcontroller SoC in 180 nm CMOS technology for nanosatellites |
| Author: |
Ge, X. Gao, W. Xue, F. Zhao, C. Zhao, Y. Li, X. Jiang, D. Liu, H. Li, Y. Sun, G. |
| Appeared in: |
Microelectronics journal |
| Paging: | Volume 87 (2019) nr. C pages 65-72 |
| Year: |
2019 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 15 of 16 found articles
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