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Journal description
All volumes of the corresponding journal
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Details for article 8 of 10 found articles
| Title: |
Charge pumping test technique using CMOS ring oscillator on leakage issue |
| Author: |
Liu, Yongbo Zhu, Zhengyong Zhu, Huilong Wan, Guangxing Li, Junfeng Zhao, Chao |
| Appeared in: |
Microelectronics journal |
| Paging: | Volume 68 (2017) nr. C pages 4 p. |
| Year: |
2017 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 8 of 10 found articles
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