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Journal description
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Details for article 2 of 47 found articles
| Title: |
A low-leakage VLSI CMOS/SOS process with thin epi layers |
| Author: |
Lee, J.Y. Mayer, D.C. Vasudev, P.K. |
| Appeared in: |
Microelectronics journal |
| Paging: | Volume 14 (1983) nr. 6 pages 8 p. |
| Year: |
1983 |
| Contents: | |
| Publisher: |
Benn Electronics Publications Ltd. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 2 of 47 found articles
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