Digital Library
Close Browse articles from a journal
 
<< previous    next >>
     Journal description
       All volumes of the corresponding journal
         All issues of the corresponding volume
           All articles of the corresponding issues
                                       Details for article 33 of 58 found articles
 
 
  Microstructural characterization of high-quality indium tin oxide films deposited by thermionically enhanced magnetron sputtering at low temperature
 
 
Title: Microstructural characterization of high-quality indium tin oxide films deposited by thermionically enhanced magnetron sputtering at low temperature
Author: Lan, Ying-Feng
Chen, Ying-Hung
He, Ju-Liang
Chang, Jing-Tang
Appeared in: Vacuum
Paging: Volume 107 (2014) nr. C pages 6 p.
Year: 2014
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 33 of 58 found articles
 
<< previous    next >>
 
 Koninklijke Bibliotheek - National Library of the Netherlands