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Journal description
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Details for article 36 of 37 found articles
| Title: |
Understanding rare safety and reliability events using transition path sampling |
| Author: |
Moskowitz, Ian H. Seider, Warren D. Patel, Amish J. Arbogast, Jeffrey E. Oktem, Ulku G. |
| Appeared in: |
Computers and chemical engineering |
| Paging: | Volume 108 (2018) nr. C pages 74-88 |
| Year: |
2018 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 36 of 37 found articles
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