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Journal description
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Details for article 8 of 23 found articles
| Title: |
Extending the relevant component analysis algorithm for metric learning using both positive and negative equivalence constraints |
| Author: |
Yeung, Dit-Yan Chang, Hong |
| Appeared in: |
Pattern recognition |
| Paging: | Volume 39 (2006) nr. 5 pages 4 p. |
| Year: |
2006 |
| Contents: | |
| Publisher: |
Pattern Recognition Society |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 8 of 23 found articles
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