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Journal description
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Details for article 2 of 22 found articles
| Title: |
Analytical parameter extraction for NBTI reaction diffusion and trapping/detrapping models |
| Author: |
Wang, YanLing Li, XiaoJin Qing, Jian Zeng, Yan Shi, YanLing Guo, Ao Hu, ShaoJian Chen, Shoumian Zhao, Yuhang |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 66 (2016) nr. C pages 6 p. |
| Year: |
2016 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 2 of 22 found articles
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