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Journal description
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Details for article 131 of 136 found articles
| Title: |
The radiation test based assessment of process quality and reliability for conventional 65-nm CMOS technology |
| Author: |
Kessarinskiy, L.N. Davydov, G.G. Boychenko, D.V. Artamonov, A.S. Nikiforov, A.Y. Yashanin, I.B. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 64 (2016) nr. C pages 4 p. |
| Year: |
2016 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 131 of 136 found articles
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