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Journal description
All volumes of the corresponding journal
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Details for article 29 of 29 found articles
| Title: |
Trapping and reliability issues in GaN-based MIS HEMTs with partially recessed gate |
| Author: |
Meneghesso, Gaudenzio Meneghini, Matteo Bisi, Davide Rossetto, Isabella Wu, Tian-Li Van Hove, Marleen Marcon, Denis Stoffels, Steve Decoutere, Stefaan Zanoni, Enrico |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 58 (2016) nr. C pages 7 p. |
| Year: |
2016 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 29 of 29 found articles
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