|
The impact on power semiconductor device operation due to local electric field alterations in the planar junction termination |
|
|
|
Titel: |
The impact on power semiconductor device operation due to local electric field alterations in the planar junction termination |
Auteur: |
Rahimo, Munaf Richter, Frank Fischer, Fabian Vemulapati, Umamaheswara Kopta, Arnost Corvasce, Chiara Geissmann, Silvan Bellini, Marco Bayer, Martin Bauer, Friedhelm |
Verschenen in: |
Microelectronics reliability |
Paginering: |
Jaargang 58 (2016) nr. C pagina's 7 p. |
Jaar: |
2016 |
Inhoud: |
|
Uitgever: |
Elsevier Ltd |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
|
|
|
|