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Journal description
All volumes of the corresponding journal
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Details for article 27 of 29 found articles
| Title: |
Techniques for dynamic analysis of bonding wire |
| Author: |
Saritas, R. Khater, M. Park, S. Dagdelen, T. Abdel-Rahman, E. Yavuz, M. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 58 (2016) nr. C pages 9 p. |
| Year: |
2016 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 27 of 29 found articles
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