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Journal description
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Details for article 1 of 20 found articles
| Title: |
A bitstream readback-based automatic functional test and diagnosis method for Xilinx FPGAs |
| Author: |
Ruan, Aiwu Jie, Bairui Wan, Li Yang, Junhao Xiang, Chuanyin Zhu, Zujian Wang, Yu |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 54 (2014) nr. 8 pages 9 p. |
| Year: |
2014 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 1 of 20 found articles
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