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Journal description
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Details for article 4 of 21 found articles
| Title: |
Characterization of interface state density of three-dimensional Si nanostructure by charge pumping measurement |
| Author: |
Dou, Chunmeng Shoji, Tomoya Nakajima, Kazuhiro Kakushima, Kuniyuki Ahmet, Parhat Kataoka, Yoshinori Nishiyama, Akira Sugii, Nobuyuki Wakabayashi, Hitoshi Tsutsui, Kazuo Natori, Kenji Iwai, Hiroshi |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 54 (2014) nr. 4 pages 5 p. |
| Year: |
2014 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 4 of 21 found articles
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