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                                       Details for article 28 of 43 found articles
 
 
  Investigation of high performance Edge Lifted Capacitors reliability for GaAs and GaN MMIC technology
 
 
Title: Investigation of high performance Edge Lifted Capacitors reliability for GaAs and GaN MMIC technology
Author: Weng, Ming-Hung
Chen, Chao-Hung
Lin, Che-Kai
Huang, Shih-Hui
Du, Jhih-Han
Peng, Sheng-Wen
Wohlmuth, Walter
Chou, Frank Yung-Shi
Hua, Chang-Hwang
Appeared in: Microelectronics reliability
Paging: Volume 54 (2014) nr. 12 pages 7 p.
Year: 2014
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 28 of 43 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands