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Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 17 of 49 found articles
| Title: |
Endurance behavior of conductive yarns |
| Author: |
de Vries, Hans Cherenack, Kunigunde H. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 54 (2014) nr. 1 pages 4 p. |
| Year: |
2014 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 17 of 49 found articles
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