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                                       Details for article 15 of 117 found articles
 
 
  Applying Bayesian mixtures-of-experts models to statistical description of smart power semiconductor reliability
 
 
Title: Applying Bayesian mixtures-of-experts models to statistical description of smart power semiconductor reliability
Author: Bluder, Olivia
Glavanovics, Michael
Pilz, Jürgen
Appeared in: Microelectronics reliability
Paging: Volume 51 (2011) nr. 9-11 pages 5 p.
Year: 2011
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 15 of 117 found articles
 
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