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                                       Details for article 48 of 48 found articles
 
 
  Using S-parameter measurements to determine the threshold voltage, gain factor, and mobility degradation factor for microwave bulk-MOSFETs
 
 
Title: Using S-parameter measurements to determine the threshold voltage, gain factor, and mobility degradation factor for microwave bulk-MOSFETs
Author: Álvarez-Botero, Germán
Torres-Torres, Reydezel
Murphy-Arteaga, Roberto
Appeared in: Microelectronics reliability
Paging: Volume 51 (2011) nr. 2 pages 8 p.
Year: 2011
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 48 of 48 found articles
 
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