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Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 29 of 48 found articles
| Title: |
Investigation of power Trench MOSFETs with retrograde body profile |
| Author: |
Wang, Ying Cheng, Chao Hu, Hai-fan |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 51 (2011) nr. 2 pages 4 p. |
| Year: |
2011 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 29 of 48 found articles
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