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Details for article 19 of 48 found articles
| Title: |
1/f Noise in GaN HEMTs grown under Ga-rich, N-rich, and NH3-rich conditions |
| Author: |
Roy, Tania Puzyrev, Yevgeniy S. Zhang, En Xia DasGupta, Sandeepan Francis, Sarah A. Fleetwood, Daniel M. Schrimpf, Ronald D. Mishra, Umesh K. Speck, James S. Pantelides, Sokrates T. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 51 (2011) nr. 2 pages 5 p. |
| Year: |
2011 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 19 of 48 found articles
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