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Journal description
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Details for article 15 of 48 found articles
| Title: |
Critical factors influencing the voltage robustness of AlGaN/GaN HEMTs |
| Author: |
Cäsar, M. Dammann, M. Polyakov, V. Waltereit, P. Quay, R. Mikulla, M. Ambacher, O. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 51 (2011) nr. 2 pages 5 p. |
| Year: |
2011 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 15 of 48 found articles
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