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Journal description
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Details for article 11 of 23 found articles
| Title: |
Failure and degradation mechanisms of high-power white light emitting diodes |
| Author: |
Yang, Shih-Chun Lin, Pang Wang, Chien-Ping Huang, Sheng Bang Chen, Chiu-Ling Chiang, Pei-Fang Lee, An-Tse Chu, Mu-Tao |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 50 (2010) nr. 7 pages 6 p. |
| Year: |
2010 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 11 of 23 found articles
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