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Journal description
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Details for article 15 of 43 found articles
| Title: |
Electrical characteristics of nMOSFETs fabricated on hybrid orientation substrate with amorphization/templated recrystallization method |
| Author: |
Huang, Po Chin Wu, San Lein Chang, Shoou Jinn Huang, Yao Tsung Lin, Chien Ting Ma, Mike Cheng, Osbert |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 50 (2010) nr. 5 pages 4 p. |
| Year: |
2010 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 15 of 43 found articles
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