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Journal description
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Details for article 21 of 25 found articles
| Title: |
Predictive modeling of board level shock-impact reliability of the HVQFN-family |
| Author: |
de Vries, J. Balemans, W. van Driel, W.D. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 50 (2010) nr. 2 pages 7 p. |
| Year: |
2010 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 21 of 25 found articles
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