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Details for article 17 of 25 found articles
| Title: |
Modeling the charge transport mechanism in amorphous Al2O3 with multiphonon trap ionization effect |
| Author: |
Novikov, Yu.N. Vishnyakov, A.V. Gritsenko, V.A. Nasyrov, K.A. Wong, H. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 50 (2010) nr. 2 pages 4 p. |
| Year: |
2010 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 17 of 25 found articles
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