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Details for article 20 of 24 found articles
| Title: |
Reliability of large periphery GaN-on-Si HFETs |
| Author: |
Singhal, S. Li, T. Chaudhari, A. Hanson, A.W. Therrien, R. Johnson, J.W. Nagy, W. Marquart, J. Rajagopal, P. Roberts, J.C. Piner, E.L. Kizilyalli, I.C. Linthicum, K.J. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 46 (2006) nr. 8 pages 7 p. |
| Year: |
2006 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 20 of 24 found articles
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