Digital Library
Close Browse articles from a journal
 
<< previous    next >>
     Journal description
       All volumes of the corresponding journal
         All issues of the corresponding volume
           All articles of the corresponding issues
                                       Details for article 13 of 26 found articles
 
 
  Electronic circuit reliability modeling
 
 
Title: Electronic circuit reliability modeling
Author: Bernstein, Joseph B.
Gurfinkel, Moshe
Li, Xiaojun
Walters, Jörg
Shapira, Yoram
Talmor, Michael
Appeared in: Microelectronics reliability
Paging: Volume 46 (2006) nr. 12 pages 23 p.
Year: 2006
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 13 of 26 found articles
 
<< previous    next >>
 
 Koninklijke Bibliotheek - National Library of the Netherlands