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Defect detection and modelling using pulsed electrical stress for reliability investigations of InGaP HBT |
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Titel: |
Defect detection and modelling using pulsed electrical stress for reliability investigations of InGaP HBT |
Auteur: |
Sydlo, C. Mottet, B. Ganis, H. Hartnagel, H.L. Krozer, V. Delage, S.L. Cassette, S. Chartier, E. Floriot, D. Bland, S. |
Verschenen in: |
Microelectronics reliability |
Paginering: |
Jaargang 41 (2001) nr. 9-10 pagina's 5 p. |
Jaar: |
2001 |
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Uitgever: |
Published by Elsevier B.V. |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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