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                                       Details for article 9 of 22 found articles
 
 
  Ka-band InP high electron mobility transistor monolithic microwave integrated circuit reliability
 
 
Title: Ka-band InP high electron mobility transistor monolithic microwave integrated circuit reliability
Author: Paine, B.M
Wong, R.C
Schmitz, A.E
Walden, R.H
Nguyen, L.D
Delaney, M.J
Hum, K.C
Appeared in: Microelectronics reliability
Paging: Volume 41 (2001) nr. 8 pages 8 p.
Year: 2001
Contents:
Publisher: Elsevier Science Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 9 of 22 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands