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Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 5 of 22 found articles
| Title: |
Electrical probing of deep sub-micron integrated circuits using scanning probes |
| Author: |
Krieg, K Thomson, D.J Bridges, G.E |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 41 (2001) nr. 8 pages 7 p. |
| Year: |
2001 |
| Contents: | |
| Publisher: |
Elsevier Science Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 5 of 22 found articles
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