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Journal description
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Details for article 8 of 37 found articles
| Title: |
Epitaxial, high-K dielectrics on silicon: the example of praseodymium oxide |
| Author: |
Osten, H.J. Liu, J.P. Müssig, H.-J. Zaumseil, P. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 41 (2001) nr. 7 pages 4 p. |
| Year: |
2001 |
| Contents: | |
| Publisher: |
Elsevier Science Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 8 of 37 found articles
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