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                                       Details for article 37 of 37 found articles
 
 
  Wear-out, breakdown occurrence and failure detection in 18–25 Å ultrathin oxides
 
 
Title: Wear-out, breakdown occurrence and failure detection in 18–25 Å ultrathin oxides
Author: Monsieur, F.
Vincent, E.
Pananakakis, G.
Ghibaudo, G.
Appeared in: Microelectronics reliability
Paging: Volume 41 (2001) nr. 7 pages 5 p.
Year: 2001
Contents:
Publisher: Elsevier Science Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 37 of 37 found articles
 
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