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                                       Details for article 27 of 37 found articles
 
 
  Quality assessment of thin oxides using constant and ramped stress measurements
 
 
Title: Quality assessment of thin oxides using constant and ramped stress measurements
Author: Diestel, Gunnar
Martin, Andreas
Kerber, Martin
Schlemm, Alfred
Erlenmaier, Horst
Murr, Bernhard
Preussger, Andreas
Appeared in: Microelectronics reliability
Paging: Volume 41 (2001) nr. 7 pages 4 p.
Year: 2001
Contents:
Publisher: Elsevier Science Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 27 of 37 found articles
 
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