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                                       Details for article 17 of 37 found articles
 
 
  Local current fluctuations before and after breakdown of thin SiO2 films observed with conductive atomic force microscope
 
 
Title: Local current fluctuations before and after breakdown of thin SiO2 films observed with conductive atomic force microscope
Author: Porti, M
Blasco, X
Nafrı́a, M
Aymerich, X
Olbrich, A
Ebersberger, B
Appeared in: Microelectronics reliability
Paging: Volume 41 (2001) nr. 7 pages 4 p.
Year: 2001
Contents:
Publisher: Elsevier Science Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 17 of 37 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands