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                                       Details for article 10 of 37 found articles
 
 
  Flat band voltage shift and oxide properties after rapid thermal annealing
 
 
Title: Flat band voltage shift and oxide properties after rapid thermal annealing
Author: O'Sullivan, B.J.
Hurley, P.K.
Cubaynes, F.N.
Stolk, P.A.
Widdershoven, F.P.
Appeared in: Microelectronics reliability
Paging: Volume 41 (2001) nr. 7 pages 4 p.
Year: 2001
Contents:
Publisher: Elsevier Science Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 10 of 37 found articles
 
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