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                                       Details for article 1 of 37 found articles
 
 
  Body effect induced wear-out acceleration in ultra-thin oxides
 
 
Title: Body effect induced wear-out acceleration in ultra-thin oxides
Author: Bruyère, S.
Roy, D.
Robilliart, E.
Vincent, E.
Ghibaudo, G.
Appeared in: Microelectronics reliability
Paging: Volume 41 (2001) nr. 7 pages 4 p.
Year: 2001
Contents:
Publisher: Elsevier Science Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

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