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                                       Details for article 10 of 18 found articles
 
 
  Improved analysis of low frequency noise in dynamic threshold MOS/SOI transistors
 
 
Title: Improved analysis of low frequency noise in dynamic threshold MOS/SOI transistors
Author: Haendler, S
Jomaah, J
Ghibaudo, G
Balestra, F
Appeared in: Microelectronics reliability
Paging: Volume 41 (2001) nr. 6 pages 6 p.
Year: 2001
Contents:
Publisher: Elsevier Science Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 10 of 18 found articles
 
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