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Journal description
All volumes of the corresponding journal
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Details for article 8 of 19 found articles
| Title: |
Extraction of the lateral distribution of interface traps in MOSFETs by a novel combined gated-diode technique |
| Author: |
He, Jin Zhang, Xing Huang, Ru Wang, Yangyuan |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 41 (2001) nr. 12 pages 5 p. |
| Year: |
2001 |
| Contents: | |
| Publisher: |
Elsevier Science Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 8 of 19 found articles
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