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Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
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Details for article 6 of 19 found articles
| Title: |
Degradation of thin oxides during electrical stress |
| Author: |
Bersuker, Gennadi Jeon, Yongjoo Huff, Howard R |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 41 (2001) nr. 12 pages 9 p. |
| Year: |
2001 |
| Contents: | |
| Publisher: |
Elsevier Science Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 6 of 19 found articles
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