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Journal description
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All articles of the corresponding issues
Details for article 11 of 19 found articles
| Title: |
Low and high temperature device reliability investigations of buried p-channel MOSFETs of a 0.17 μm technology |
| Author: |
Ambatiello, Alexander Deichler, Josef |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 41 (2001) nr. 12 pages 7 p. |
| Year: |
2001 |
| Contents: | |
| Publisher: |
Elsevier Science Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 11 of 19 found articles
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