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Journal description
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Details for article 2 of 21 found articles
| Title: |
A method of thermal testing of microsystems |
| Author: |
Bratek, Piotr Kos, Andrzej |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 41 (2001) nr. 11 pages 11 p. |
| Year: |
2001 |
| Contents: | |
| Publisher: |
Elsevier Science Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 2 of 21 found articles
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