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Journal description
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Details for article 10 of 21 found articles
| Title: |
Electrothermal model for simulation of bulk-Si and SOI diodes in ESD protection circuits |
| Author: |
Wang, Yu Juliano, Patrick Joshi, Sopan Rosenbaum, Elyse |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 41 (2001) nr. 11 pages 7 p. |
| Year: |
2001 |
| Contents: | |
| Publisher: |
Elsevier Science Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 10 of 21 found articles
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