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Journal description
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Details for article 58 of 87 found articles
| Title: |
Relation between robustness against ESD and against flash events in deflection amplifiers |
| Author: |
van Roijen, R. Ludikhuize, A.W. Voets, J. van Oosten, P. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 40 (2000) nr. 8-10 pages 4 p. |
| Year: |
2000 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 58 of 87 found articles
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