|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 70 of 73 found articles
| Title: |
Trapping mechanisms in negative bias temperature stressed p-MOSFETs |
| Author: |
Schlünder, Christian Brederlow, Ralf Wieczorek, Peter Dahl, Claus Holz, Jürgen Röhner, Michael Kessel, Sylvia Herold, Volker Goser, Karl Weber, Werner Thewes, Roland |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 39 (1999) nr. 6-7 pages 6 p. |
| Year: |
1999 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 70 of 73 found articles
| << previous | next >> |