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Details for article 7 of 15 found articles
| Title: |
ESD laboratory simulations and signature analysis of a CMOS programmable logic product 1 1 The following is a condensed and revised version of the original paper presented at ISTFA-94: Proceedings of the 20th International Symposium for testing and Failure Analysis, p117 (1994), Henry et al., see ref[26]. |
| Author: |
Henry, L.G. Raymond, T. Mahanpour, M. Morgan, I. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 38 (1998) nr. 11 pages 7 p. |
| Year: |
1998 |
| Contents: | |
| Publisher: |
Elsevier Science Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 7 of 15 found articles
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