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Journal description
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Details for article 14 of 17 found articles
| Title: |
The influence of addition elements on the early resistance changes observed during electromigration testing of Al metal lines |
| Author: |
De Ceuninck, W.A D'Haeger, V Van Olmen, J Witvrouw, A Maex, K De Schepper, L De Pauw, P Pergoot, A |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 38 (1998) nr. 1 pages 12 p. |
| Year: |
1998 |
| Contents: | |
| Publisher: |
Elsevier Science Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 14 of 17 found articles
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