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Details for article 1 of 120 found articles
| Title: |
Acceleration of the goodness-on-fit test by using the programme for EDA. A proposal of BWP on the Weibull plot and a study of applying BWP to censored data |
| Author: | |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 33 (1993) nr. 13 pages 1 p. |
| Year: |
1993 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 1 of 120 found articles
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