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Journal description
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Details for article 114 of 157 found articles
| Title: |
Reliability analysis in the presence of chance common cause shock failures |
| Author: |
Chari, A.A. Sastry, M.P. Madhusudana Verma, S. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 31 (1991) nr. 1 pages 5 p. |
| Year: |
1991 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 114 of 157 found articles
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